30 results
In-Situ Stress Control During Sputter Deposition
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- Journal:
- MRS Online Proceedings Library Archive / Volume 306 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 275
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- 1993
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Roughness Effects During Focused Ion Beam Repair of X-Ray Masks with Polycrystalline Tungsten Absorbers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 279 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 593
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- 1992
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The nature of residual stress, defects, and device characteristics for thick single-crystalline Si films on oxidized Si wafers
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- Journal:
- Journal of Materials Research / Volume 3 / Issue 3 / June 1988
- Published online by Cambridge University Press:
- 31 January 2011, pp. 514-520
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- June 1988
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Drift of Arsenic in SiO2 in a Lamp Furnace With a Built-In Temperature Gradient
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- Journal:
- MRS Online Proceedings Library Archive / Volume 92 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 53
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- 1987
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Arsenic in SiO2 - Phase Segregation, Drift, and Diffusion Phenomena
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- MRS Online Proceedings Library Archive / Volume 105 / 1987
- Published online by Cambridge University Press:
- 22 February 2011, 47
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- 1987
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Epitaxial Crystallization of Ge on Si Using Evaporation and Recrystallization Techniques
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- Journal:
- MRS Online Proceedings Library Archive / Volume 67 / 1986
- Published online by Cambridge University Press:
- 25 February 2011, 259
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- 1986
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Material Characterization of Epitaxial GaAs and Ge Films on (100) Si Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 67 / 1986
- Published online by Cambridge University Press:
- 25 February 2011, 93
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- 1986
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Improved Soi Films By High Dose Oxygen Implantation and Lamp Annealing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 53 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 227
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- 1985
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Influence of Crystalline Structure on Performance of Thin Film Transistors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 33 / 1984
- Published online by Cambridge University Press:
- 21 February 2011, 127
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- 1984
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Computer Modeling of Lateral Epitaxial Growth Over Oxide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 35 / 1984
- Published online by Cambridge University Press:
- 25 February 2011, 623
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- 1984
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Incoherent Light Recrystallization of Silicon-On-Insulator Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 33 / 1984
- Published online by Cambridge University Press:
- 21 February 2011, 71
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- 1984
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Kinetics of Radiative Melting of Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 35 / 1984
- Published online by Cambridge University Press:
- 25 February 2011, 635
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- 1984
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Characteristics of Short-Channel Mosfet's in Laser Crystallized Si-on-Insulator
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- Journal:
- MRS Online Proceedings Library Archive / Volume 23 / 1983
- Published online by Cambridge University Press:
- 22 February 2011, 559
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- 1983
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Thick Films for Dielectric Isolation by Lateral Epitaxy from the Melt
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- Journal:
- MRS Online Proceedings Library Archive / Volume 23 / 1983
- Published online by Cambridge University Press:
- 22 February 2011, 567
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- 1983
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Faceted Melting and Superheating of Crystalline Si Irradiated with Incoherent Light
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- Journal:
- MRS Online Proceedings Library Archive / Volume 23 / 1983
- Published online by Cambridge University Press:
- 22 February 2011, 409
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- 1983
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Laser and Electron Beam Interactions with Solids
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- Journal:
- MRS Bulletin / Volume 7 / Issue 1 / February 1982
- Published online by Cambridge University Press:
- 18 October 2013, pp. 4-5
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- February 1982
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Defect Control During Epitaxial Regrowth by Rapid Thermal Annealing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 13 / 1982
- Published online by Cambridge University Press:
- 15 February 2011, 349
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- 1982
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Lateral Epitaxial Growth of Thick Polysilicon Films on Oxidized 3-Inch Wafers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 13 / 1982
- Published online by Cambridge University Press:
- 15 February 2011, 575
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- 1982
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Laser Processing of Porous Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 4 / 1981
- Published online by Cambridge University Press:
- 15 February 2011, 609
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- 1981
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Characterization of Ion-Implanted Si Rapidly Annealed with Incoherent Light
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- Journal:
- MRS Online Proceedings Library Archive / Volume 4 / 1981
- Published online by Cambridge University Press:
- 15 February 2011, 765
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- 1981
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